Joint Postgradustes | 联合培养
Xiaoman Yang | 杨晓曼
Yang Xiaoman is a 2025-entry PhD student in the Department of Computer Science and Engineering at The Chinese University of Hong Kong (CUHK). Her research interests primarily focus on multi-physics modeling and electromigration reliability analysis of backside power delivery networks, electromigration reliability analysis of through-silicon vias (TSVs), and simulation acceleration. During her master's studies, she published papers in ICCAD, a conference in the EDA field, and ACM TODAES. She also received the National Scholarship for Postgraduates and was awarded the title of "Shanghai Outstanding Graduate".
Education Experience
2025/08 - Present PhD Student, Department of Computer Science and Engineering, The Chinese University of Hong Kong
2022/09 - 2025/03 Master Student, Department of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University
2018/08 - 2022/06 Bachelor, Major in Electronic Information Science and Technology, School of Electronic Science and Engineering, Jilin University